Used HITACHI S-9380 II #9269824 for sale

HITACHI S-9380 II is an advanced scanning electron microscope (SEM) designed to enable researchers to explore the nano- and micro-scale features of samples with high resolution and sensitivity. This SEM combines analytical capabilities with a high degree of automation to streamline image acquisition and analysis. HITACHI S9380 II utilizes a Cold Field Emission (CF) gun to produce high resolution images of nanoscale features. It is capable of magnifying samples up to 1000,000x with the ability to measure very small features such as individual atoms or molecules. The high resolution images are enabled by the precision of the electron gun, which is capable of producing a beam of electrons with a size of 1.2nm, and the stability of the image conditions achieved within the instrument. The SEM is equipped with a reduced-pressure imaging equipment that minimizes contamination caused by gas molecules, which is ideal for exploring delicate samples such as proteins or organic molecules. Additionally, it is equipped with an automated sample stage, which enables the specimen to be tilted in order to observe multiple facets of the sample. The automated sample stage and imaging system of S-9380-II can be programmed to scan the sample and acquire data, enabling researchers to capture high-resolution images over large areas. The software included with the unit allows users to generate 3D, virtual images of the sample from the data gathered with the automated scan. HITACHI S-9380-II also includes a number of analytical capabilities, such as EDX (energy dispersive X-ray spectroscopy) and CL (cathodoluminescence), which enable researchers to identify and quantify the elemental composition of the specimen from within the SEM. In addition to its imaging and analytical capabilities, S-9380 II is equipped with software interfaces that allow users to easily control the machine's operation and transfer acquired data to external systems for further analysis. Overall, S 9380 II is a powerful and advanced scanning electron microscope designed to meet the needs of researchers exploring the micro- and nanoscale features of samples. With its high resolution imaging capabilities, use of automated scanning, and integrated analytical systems, HITACHI S 9380 II is an ideal tool for exploring the nanoscale features of specimens.