Used HITACHI S-9380 II #9273525 for sale

HITACHI S-9380 II is a scanning electron microscope (SEM) designed to take close-up images of surfaces by scanning the surface with a focused electron beam. It has an acceleration voltage up to 30 kV and a resolution of 0.9 nm @ 15 kV. Its flexible E-Beam Power Control enables the microscope to be used for a range of applications, including analytical electron tomography. The microscope is equipped with a LaB6 (Lanthanum Hexaboride) electron gun emitting an electron beam with a high current density for precise surface imaging. This enhanced performance makes it suitable for a variety of applications, ranging from surface imaging to nano-scale structure analysis. HITACHI S9380 II also has a variety of sample handling tools, including a sample transfer system, a sample rotational stage, and a sample heating stage. It's a versatile, high-resolution SEM that is ideal for high-end analytical imaging and research applications. The microscope offers a variety of detectors to capture the image, which can be selected based on the requirements of the user. These include an ever-cooled secondary electron detector (SED), an ever-cooled Backscatter Electron Detector (BES), and an ever-charged differential pulse Charge Detector (DCPD). It also has automated functions that facilitate operation, including a novel Auto Focus and Sample Alignment (AFSA) system, automatic beam centering, and image stitching. This system allows users to effortlessly take repeatable scans from sample to sample. With its combination of high resolution, high throughput, and versatile sample manipulation tools, S-9380-II can be used for nanometer-scale imaging and high-end analytical tomography. Its superior performance and versatility make it suitable for a wide range of research applications.