Used HITACHI S-9380 Type II #9235808 for sale

HITACHI S-9380 Type II
ID: 9235808
Scanning Electron Microscopes (SEM), 12".
HITACHI S-9380 Type II is a state-of-the-art scanning electron microscope (SEM) designed for the high-resolution observation and analysis of non-conductive samples from a variety of industries. S-9380 Type II offers excellent performance with a range of imaging and analytical capabilities, making it suitable for various applications ranging from material science to life sciences. HITACHI S-9380 Type II is equipped with a range of components that provide precision imaging and analysis. At the core of the scanning electron microscope, S-9380 Type II is fitted with an aberration-corrected Schottky field emission electron gun for high-resolution imaging and elemental analysis. This electron gun is capable of acceleration voltages between 1 and 50 kV and the secondary electron detector has a magnification range from 1 to 50k. The microscope also includes a range of additional detectors, such as a solid-state energy-dispersive X-ray spectrometer and a cathodoluminescence detector for elemental composition analysis and luminescent imaging of samples respectively. HITACHI S-9380 Type II has an aperture angle of 30˚ with a large working distance of 135mm. This allows for a full 360˚ view of samples without being obstructed or confined to a specific viewing position. The microscope also features tilt and rotational movements with respect to the sample for enhanced imaging and accurate alignment of the electron beam for elemental analyses. Additionally, the unique electrostatic 3D focus monitor assists in accurate 3D fine focusing of the sample surface for superior imaging results. The combination of the aberration-corrected field emission electron gun, multiple detectors and full-circle view make S-9380 Type II an ideal candidate for research and development in a range of industries. The microscope's superior performance combined with its usability and automated features make it an excellent tool for both experienced analysts and those new to SEM analysis.
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