Used HITACHI S-9380 Type II #9236033 for sale
URL successfully copied!
ID: 9236033
Wafer Size: 12"
Vintage: 2005
Scanning Electron Microscopes (SEM), 12"
2005 vintage.
HITACHI S-9380 Type II Scanning Electron Microscope (SEM) is an advanced analytical imaging microscope capable of providing high-resolution images of up to 130,000 times the field of view of conventional light microscopes. The instrument employs a cathode ray gun to send electrons through a single grid into a specimen. A detector collects the secondary electrons emitted from the specimen and the image is computed by a dedicated signal processor. The S-9380 is designed for general laboratory use, providing high resolution imaging for a range of applications including crystallography and materials science. The unit features an ergonomically designed control panel with a 3-axis joystick for precise positioning, and a large-format color LCD display for monitoring the specimen in real time. Specs-wise, the S-9380 features a high-resolution aiming system, which allows for precise voltages and various magnification levels for specimen imaging. It also has adjustable field emission imaging, accelerating voltage of up to 30KV, rotary stage control, and a choice of region or full field imaging. A variety of detectors are available for scanning electron microscopist including in-lens, multichannel, multiple field, and scanning ion imaging configurations. S-9380 Type II also offers advanced automation and computer control capabilities, allowing the user to customize settings or create automated measurement procedures. The unit is compatible with a variety of imaging and measurement software, and its self-test function ensures reliable operation. Overall, HITACHI S-9380 Type II SEM is an ideal instrument for efficient, accurate imaging of a range of materials and specimen types. Its combination of user-friendly control panel, adjustable imaging parameters, automation features, and compatibility with various imaging software make it an ideal choice for laboratories seeking a high-performance on-site scanning electron microscope.
There are no reviews yet