Used HITACHI S-9380 Type II #9236035 for sale

HITACHI S-9380 Type II is a field emission scanning electron microscope (FESEM) used for a variety of applications. This microscope offers a variety of high-performance features, including a low-vacuum imaging equipment, an imaging chamber with an in-lens grid, a variable accelerating voltage, and a SE/BSE detector. Additionally, its coupling system is designed to be compatible with a variety of specimen stages, enabling the S-9380 to carry out a range of tasks. The S-9380 is capable of achieving high resolution using a variable accelerating voltage up to 30 keV. The accelerating voltage range of the S-9380 can be adjusted in real-time, allowing users to select the best parameters for their application. Furthermore, the S-9380's electron optics unit permits observation of a variety of samples. Additionally, the S-9380 is designed to be compatible with a variety of specimen stages, including a cold stage, an in-lens grid, and a "supertomography" stage. The S-9380 is equipped with a low-vacuum imaging machine. This tool is capable of capturing images with high resolution at various stages of the sample preparation process. Moreover, the S-9380 is designed to perform high-resolution imaging of dense and non-conductive specimens. The imaging chamber of the S-9380 is equipped with an in-lens grid. This grid is designed to prevent undesirable electrons from impinging on the sample, thus enabling a high contrast image with low background noise. This makes the S-9380 a suitable microscope for imaging specimens with high dielectric constants. The S-9380 is also equipped with an electron detector that enables simultaneous SE (secondary electron) and BSE (back scattered electron) imaging. The detector also permits an image resolution of 5 nm. Furthermore, the S-9380's detector is equipped with a signal-to-noise ratio of up to 4,000. This makes it a suitable instrument for carrying out a variety of imaging techniques, such as diffraction and tomography. The S-9380 is an exceptional field emission scanning electron microscope (FESEM). This microscope is equipped with a variety of features, including a low-vacuum imaging asset, an in-lens grid, a variable accelerating voltage, and an SE/BSE detector. Additionally, the S-9380 can be connected to a number of different specimen stages, allowing users to choose the most suitable setup for their application. The S-9380 is an excellent choice for a variety of applications, including imaging samples with high dielectric constants, and performing high-resolution imaging and diffraction tasks.