Used HITACHI S-9380 Type II #9236749 for sale

HITACHI S-9380 Type II
ID: 9236749
Vintage: 2006
Scanning Electron Microscope (SEM) 2006 vintage.
HITACHI S-9380 Type II scanning electron microscope is an advanced laboratory instrument designed to inspect the structure and composition of a wide variety of materials. It produces images by scanning a finely focused electron beam across a specimen's surface and continuously detecting the signal resulting from secondary electrons. This type of microscope enables magnifications up to 500,000x and resolutions as low as 0.8nm in the lateral direction and 0.3nm in the vertical direction, making it ideal for applications requiring analysis on the nanoscale. The microscope includes an environmental chamber which can apply a wide range of environmental conditions to the specimen, including temperatures from -100C to 400C, vapour pressures as low as 0.1 Pa and dissolved gases, such as argon and helium. This feature enables users to perform a range of experiments under precisely controlled conditions which could not be otherwise performed, such as observing the dynamic changes of an organic sample under varying electric fields or simulating aging processes in a precisely measured time frame. The instrument is designed with imaging, analysis, measurement, and sample manipulation in mind. It includes several features aimed to improve the data yield and quality, such as automated drift correction, automatic exposure control, and multi-pass scanning for large samples. By combining the heterogeneity information of the surface and composition of the specimen, the instrument offers excellent versatility for the end user. The tools available for data analysis and manipulation drive the instrument's workflow. The software suite includes image processing programs to enhance the visibility of features, 3D reconstructions, compositional analysis tools, as well as a wide range of user defined options for automation and analysis capabilities. In conclusion, S-9380 Type II scanning electron microscope is an advanced instrument which provides superior performance for applications requiring analysis on a nanoscale and a wide range of features which enable versatile experimentation under precise environmental conditions. Users of the microscope benefit from a well designed system equipped to quickly capture and analyze data and the software suite enables users to take advantage of the features available on the instrument.
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