Used HITACHI S-9380 Type II #9251073 for sale

HITACHI S-9380 Type II scanning electron microscope is a powerful analytical instrument designed to provide incredibly high resolution images of a wide range of samples. It offers high performance imaging capabilities for advanced materials research. The instrument operates through electrostatic scanning of a sample across a wide area of up to 200mm in diameter and at up to 480?m resolution. This makes it ideal for analysing samples in a variety of materials, including biological samples, semiconductors, and metal alloys. The microscope is designed with an interactive interface to allow for easy operation and calibration of the instrument. S-9380 Type II features a high-sensitivity, low-noise digital camera coupled with the ability to accurately measure the topography of a sample. This makes it ideal for imaging sample morphology. It also includes techniques such as time-of-flight and secondary electron analysis, making it suitable for a variety of applications. The system is equipped with energy-dispersive X-ray spectroscopy (EDS) to enable the analysis of elemental composition within a specimen. EDS is a powerful tool for characterizing any material and can yield elemental maps of samples with a resolution of 20?m. It utilizes an energy-dispersive X-ray source for observation of elements from concentrations down to 0.1%. The S-9380 also features a system for analyzing sample surfaces with the capability of simulating 3D conditions. This is done through an automated routine for analyzing the shape, surface finish, and other physical characteristics of sample surfaces. In addition to the capabilities of HITACHI S-9380 Type II, it also features a software package which allows for analysis of multiple images to generate 3D models of samples. This helps accurately map out the surface finish, shape, and other microscopic features of a sample. The software also enables the user to easily adjust parameters, such as image enhancement and settings, to optimize results. S-9380 Type II scanning electron microscope is a powerful instrument that is capable of accurately characterizing a broad range of materials with the highest level of precision. It is an ideal tool for anyone who needs to analyse minute samples in mission-critical research for industries ranging from semiconductor manufacturing to biomedical research.