Used HITACHI S-9380 Type II #9251785 for sale

HITACHI S-9380 Type II is a scanning electron microscope (SEM) designed for high resolution imaging and analysis of a wide range of material samples. This model features an easy-to-use computer-assisted operation panel, a proprietary electronic-scanning equipment and an improved microscope stage. The microscopy stages available with this model can accommodate a variety of sample sizes, offering maximum flexibility. Additionally, its unique scan generator, built-in autotuning functions, and high-precision pattern control system ensure reliable performance. This high resolution SEM achieves a maximum magnification of 300,000 times and overall unit resolution of 1 nanometer. Its secondary electron detector can acquire high-resolution images of the surface while its backscattered electron detector is used for acquiring elemental analysis images. In terms of control, S-9380 Type II is capable of automatic adjustment of the electron gun, camera settings, pulse counting, energy calibration, and vacuum control. It also features an automatic 3-Axis stage control to precisely move and focus the sample. This mode possesses an innovative auto-alignment function that can rapidly modify the tilt angle of the sample to a user-specified range. HITACHI S-9380 Type II microscope also provides a user-friendly software interface that allows for easy navigation of the scanning electron microscope's functions. Its sophisticated graphical user interface enables users to quickly acquire data, including images and spectra. Furthermore, this SEM has enhanced connectivity, as its high-speed Ethernet connection allows for real-time remote operations and data sharing. Overall, S-9380 Type II is an advanced scanning electron microscope that provides great levels of flexibility and control. The combination of its high resolution imaging, sophisticated auto-adjustment machine, and user-friendly software interface make it a top choice for acquiring accurate surface and elemental analysis images and data.