Used HITACHI S-9380 Type II #9276374 for sale
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ID: 9276374
Wafer Size: 12"
Critical Dimension Scanning Electron Microscope (CD-SEM), 12"
VID: VID753
Resolution: 2nm
Throughput: 33 Wafer/h
MAM Time: 4.0 Sec
Stage landing accuracy: ±1μm.
HITACHI S-9380 Type II scanning electron microscope (SEM) is a highly sophisticated analytical tool for the examination of samples and substrates at various magnifications. It is popular amongst technology and research communities for its capability to produce detailed images of scanned objects with five-dimensional resolution, which consists of length, width, depth, displacement, and orientation. The instrument is equipped with a scanning electron column with an accelerating voltage of up to 0.30 kV to 15 kV and a current of up to 10 A in scanning mode. This powerful and versatile system enables users to generate detailed images of samples with an effective magnification of up to 500,000X. Furthermore, the device's alignment systems offer precise control over the scanning area, allowing users to obtain the most accurate images and analysis. The SEM includes an in-column secondary electron detector with a wide angle optical view, high depth of view and field of view, and a large aperture lens, allowing users to capture images with high degree of clarity, crispness, and clarity. Thanks to its digital imaging capabilities, S-9380 Type II SEM produces images with a resolution of up to 1.25 nm, with the ability to capture images with up to five-dimensional resolution. Furthermore, the onboard X-EDS system allows users to perform energy-dispersive X-ray spectroscopy analysis with the help of a vacuum housing chamber. This feature enables users to quickly analyze the chemical composition and differential concentrations of elements present in a sample. Additionally, HITACHI S-9380 Type II is also equipped with a low-vacuum feature that allows users to observe non-conductive samples in their natural environment. In addition to its features, S-9380 Type II device boasts a user-friendly interface with a suite of image-processing tools allowing users to effectively manipulate their images. This makes it suitable for a variety of applications ranging from material science, semiconductor, metallurgy, geology, and various physical scientific studies. Overall, HITACHI S-9380 Type II scanning electron microscopy provides users with a powerful and versatile tool for conducting thorough, detailed imaging and spectroscopy analyses. Its user-friendly interface and highly-sophisticated technology make it an ideal choice for a variety of research and technology applications.
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