Used HITACHI S-9380 Type II #9276375 for sale
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ID: 9276375
Wafer Size: 12"
Critical Dimension Scanning Electron Microscope (CD-SEM), 12"
VID: VID753
Resolution: 2nm
Throughput: 33 Wafer/h
MAM Time: 4.0 Sec
Stage landing accuracy: ±1μm.
HITACHI S-9380 Type II Scanning Electron Microscope (SEM) is a high-tech, state-of-the-art instrument used to observe the microscopic world through high-resolution, three-dimensional imaging. It can achieve magnifications up to 500,000x and has the ability to image single particles at the nanoscale. It produces detailed images of both organic and inorganic samples by directing a beam of high-energy electrons onto them. The electrons interact with the samples, generate secondary and backscattered electrons, and these electron interactions are then detected and converted into digital images which are displayed on a computer monitor. S-9380 Type II SEM has several features which allow it to obtain high-resolution images. Its impressive optics are capable of acquiring high-resolution images with a minimum of aberrations. The electron gun is tightly focused for accurate imaging and is equipped with an ultra-high performance emitted electron detector, enabling fast and accurate imaging processes. HITACHI S-9380 Type II SEM is also equipped with a state-of-the-art energy dispersive x-ray microanalysis (EDX) system. EDX is a technique used to quickly collect data on the elemental composition of samples. This system uses a modified S-9380 Type II SEM and advanced EDX detector to measure the elemental composition of a sample quickly and accurately. HITACHI S-9380 Type II SEM is designed to be user-friendly. It comes with a comprehensive graphical user interface to guide users through their imaging sessions. Additionally, it has an auto-focus and auto-stig function which allows for easy and intuitive imaging. Finally, advanced software packages are also available providing users with a wide range of image processing capabilities to get the most out of their SEM experience. S-9380 Type II SEM is suitable for a wide range of applications, including imaging sub-micrometer-thick materials, three-dimensional imaging for metal samples, observation of live cells, and more. It is a powerful tool for research and development, quality control, and educational purposes, and can be used in a wide variety of industries from medicine to materials science.
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