Used HITACHI S-9380 Type II #9281292 for sale
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ID: 9281292
Vintage: 2004
Critical Dimension Scanning Electron Microscope (CD-SEM)
2004 vintage.
HITACHI S-9380 Type II is a high-end scanning electron microscope (SEM) used for imaging and analysis of samples at a nanometer scale. It is capable of operating at high accelerating voltages (from 0.1kV to 30kV), giving it enough power to perform imaging and analysis of incredibly fine details. Its high resolution, excellent depth of focus, and automatic image stitching capabilities make it ideally suited for tasks such as image mapping, automated scanning, and 3D reconstructions. The S-9380 is comprised of three main parts: the microscope column, the sampling chamber, and the signal processing electronics. The microscope column is the main component that houses the electron source, lenses, and detectors. It is built with an isolation chamber design that utilizes an external cooling system to maintain the vacuum required for operation. Its two-stage tridiagonal gun collimator allows for rapid changing of primary electron beam current and contrast. The sampling chamber is designed for total sample thickness analysis up to 5 mm thick. It is capable of holding a wide variety of sample configurations and is adapted for biological, organic, and anorganic samples. It is equipped with heating and cooling probes, as well as a 5-axis chuck for sample manipulation. The sample can be imaged in both vacuum and in-air environments. The signal processing electronics contain the data acquisition, image processing, and control system. This allows the user to capture high resolution images with excellent contrast and a large variety of digital signal processing tools. It also contains software for automated control and image stitching for easy visualization and 3D reconstruction. S-9380 Type II provides a powerful combination of imaging and analysis capabilities, suitable for a variety of research applications. Its high resolution, accelerations voltages, and wide range of tools allow researchers to uncover the intricate detail and structure of their samples at the nanometer scale.
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