Used HITACHI S-9380 Type II #9313108 for sale

ID: 9313108
Wafer Size: 12"
Vintage: 2009
Critical Dimension Scanning Electron Microscope (CD-SEM), 12" 2009 vintage.
HITACHI S-9380 Type II is a high resolution scanning electron microscope (SEM) developed by and for the research and industrial markets. With its standard scanning electron mode, the S-9380 provides a reliable and robust means to quickly acquire high-resolution images and measurements. The S-9380 is equipped with a field emission electron gun (FEG) that provides a stable and reproducible electron source. This ensures sample morphology is accurately represented and provides a significantly higher level of image resolution than is possible with thermionic electron sources. The S-9380 has a minimum resolution of 0.7 nm, ensuring that even the most intricate features of a sample can be clearly distinguished. The microscope is equipped with a tilt stage and an automated sample exchange equipment, providing a convenient and easy to use interface for sample analysis and imaging. The S-9380 is equipped with various detectors that provide a comprehensive range of imaging and measurement capabilities. These include a secondary and backscattered electron detectors, an eddy-current correction system, an auto-focus module, and an automated stage lift unit. The secondary electron detector allows for imaging of specimens at various magnifications and offers Z-contrast imaging. Backscattered electron imaging provides a contrast based on differences in atomic number of the sample materials. The eddy-current correction machine helps to reduce the effects of artefacts that arise due to beam-sample interactions. The S-9380 is capable of providing high resolution 3D imaging and can perform ultra-high resolution image analysis. It is also equipped with a Vector Line Scanning (VLS) tool to enable faster measurement and imaging, and a process control asset for optimizing the performance of the microscope. The S-9380 has a touch-sensitive 7-inch LCD monitor for easy control, an integrated computer, and an image processing suite, enabling users to quickly and easily analyze images and obtain reliable and accurate measurements of samples. The S-9380 is standardly equipped with a software package called MicroVision software that allows for comprehensive analysis and imaging of samples. Capable of displaying local parameters such as surface topography, chemical composition, electrical properties, and more, the S-9380 provides a comprehensive suite of tools that enables detailed sample analysis and imaging. In summary, S-9380 Type II is a high resolution SEM that combines advanced technology with excellent user ergonomics and a comprehensive set of tools that ensure accurate and reproducible imaging and measurement capabilities. It provides high resolution imaging and analysis and has a host of features that make it an ideal choice for research and industrial laboratories.
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