Used HITACHI S-9380 Type II #9314795 for sale
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ID: 9314795
Wafer Size: 12"
Vintage: 2004
Critical Dimension Scanning Electron Microscopes (CD-SEM), 12"
2004 vintage.
HITACHI S-9380 Type II is a scanning electron microscope that utilizes a number of advanced imaging technologies for capturing and analyzing samples at a magnification of up to 100,000x. It leverages a thermionic field emission electron gun to generate a highly focused beam of electrons with a spot size of less than 1.2nm and an accelerating voltage of up to 30kV. By using the fields deflection coils and special lenses, the electron beam can be scanned across a specimen surface or alternately focused onto a specific area. Once the electron beam is deflected, an electromagnetic detector records the signal creating an image. The resulting image is projected onto a video monitor and can also be transferred to a digital recorder or computer for further detailed analysis. S-9380 Type II also makes use of an Automatic Brightness Control function which allows for regulating the sample brightness and contrast for optimal results. In addition, the instrument offers a wide variety of imaging modes, such as standard STM and SEM, high-resolution SEM, low-voltage SEM, analytical imaging, and spectroscopy. By combining scanning electron microscope technology with the power of analytical spectroscopy and imaging, this instrument is capable of providing complete characterization of all types of nanostructures, from single molecules to entire integrated circuits. HITACHI S-9380 Type II integrates a wide range of application-specific accessories and options which extends its scope and capabilities even further. Specialized sample stages and jigs, such as a 3-axis stage, pinch-and-tilt stage, and Ar-ion gun, allow the instrument to explore and observe samples of varying sizes, shapes, and dispersion. Besides, a heating stage, cryogenic cooling stage, and angle approaches allow for high-resolution images of temperature-sensitive samples. Furthermore, S-9380 Type II can also be integrated with a multi-functional data processing software, allowing users to analyze and process the images to extract and analyze detailed information. The software enables users to analyze the image and measure crucial parameters, such as line features and angles, image quality and contrast, and particles size and shape. Finally, the instrument also supplies an automated scanning mode which ensures high quality data acquisition even with minimally experienced users at the helm.
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