Used HITACHI S-9380 Type II #9314796 for sale

HITACHI S-9380 Type II scanning electron microscope (SEM) is a powerful analytical instrument used in material characterization and the microstructure observation of various materials. The microscope allows for the observation of samples with high resolution magnification and imaging. This microscope has several features that make it ideal for use in industrial applications, such as high resolution imaging capabilities and the ability to image specimens quickly and efficiently. The microscope also features a specially designed control unit, which enables the user to select and adjust the microscope's imaging parameters. Furthermore, the microscope's design also provides an effective radiation protection equipment. The microscope uses electron beam which is accelerated through the interior components and applied onto the sample by a highly controllable scanning coil which is capable of moving the beam across the entire field of view. At the same time, secondary electrons released from the sample surface are then collected and focused onto the imaging system. S-9380 Type II has a magnification range of 25x to 1,000,000x and a working distance from 0.1 mm to 10 mm, allowing for fast and efficient scanning. Moreover, the microscope also provides an adjustable contrast resolution with high resolution image acquisition in an optimal time. The specimen chamber of HITACHI S-9380 Type II is equipped with several accessories, including an automatic object scanning unit, a vacuum measurement machine, a robotic sample holder and a tilt/rotation stage for sample orientation. Additionally, the microscope can be equipped with a number of additional accessories, such as beam-tilting device, chemically etched specimen holder, cryo-vac tool and cryo-thermal imaging asset (CTIS). Furthermore, the microscope has a direct imaging model that is capable of recording both single images and multi-frame images. The direct imaging equipment is equipped with a cooled CCD array that is capable of recording slow phenomena or capturing high speed events. S-9380 Type II is suitable for both routine examinations of material properties and advanced research in material science. The system is easy to install, operate and maintain, while its robust construction and design ensures high level of performance and reliability. The microscope is capable of high resolution imaging, allowing for quick and accurate measurements in various areas of scientific research.