Used HITACHI S-9380 #9244867 for sale

HITACHI S-9380 is a state-of-the-art scanning electron microscope (SEM) designed for electron beam analysis. The microscope has an integrated electrostatic lens and a strong magnet structure for excellent mapping performance and 5 nm resolution. With its advanced imaging technology, highly accurate EDX detector and automated computer control equipment, HITACHI S9380 is a powerful tool for a wide range of research fields. S 9380 makes use of a system of electrostatic lens and electromagnetic coils to achieve its high resolution. An electron source directs electrons through the lens unit to allow for high precision imaging. In addition, a strong anode, two pairs of vertical and horizontal deflectors and a Faraday cup are used to control the electron beam. This machine ensures consistent image quality and allows for optimized scan settings to be applied to a sample. The EDX detector used in S9380 is one of the most sensitive detectors available and provides a variety of signal processing functions. This detector can measure energy dispersive X-ray (EDX) signals at different voltages and angles to accurately characterize samples. The EDX detector is also capable of both in-situ and ex-situ analysis, meaning the sample can be studied without the need for scanning. HITACHI S 9380 also has an automated computer control tool that enables researchers to easily coordinate and adjust the microscope's settings. Through this asset, users can set a variety of parameters, including the beam current, kV, and spot size. This allows researchers to quickly and easily change settings to best capture images of their subjects. Finally, S-9380 is built with a sturdy magnet structure that ensures a consistently smooth and accurate scanning process. This allows researchers to maximize the high resolution achievable with the microscope and conduct investigations into a wide range of samples. In conclusion, HITACHI S-9380 is an advanced scanning electron microscope designed for electron beam analysis. This microscope has an integrated electrostatic lens model, EDX detector, and automated computer control equipment to ensure accurate results. Its strong magnet structure and 5 nm resolution enable researchers to conduct detailed studies into a variety of materials.