Used HITACHI SU-1510 #293597449 for sale

HITACHI SU-1510 is a scanning electron microscope (SEM) designed for a range of applications across a variety of disciplines. This versatile machine offers a range of uses, from simple imaging to complex structures and materials analysis. HITACHI SU1510 features a maximum magnification of up to 250,000x (250 kx) and a resolution of up to 2 nanometers. Its highly sensitive in-lens detector, coupled with its high vacuum operation, provides detailed imaging and analysis across a diverse range of samples, including wet and dry specimens. The vacuum levels delivered by SU 1510 ensure extremely low residual gas concentrations and top-quality samples, even when working at the highest magnifications. The specialist analyzers available with HITACHI SU 1510 allow users to collect data and observe phenomena such as image quality, elemental composition, and surface and subsurface information. The EDX option available with the microscope provides elemental analysis of a sample in 3D, allowing users to go beyond basic imaging and into a deeper understanding of their data. For imaging, SU-1510 features an EFTEM detector, which allows for the manipulation of digital images for the purposes of creating consistent, high-quality results. This offers users an excellent way to obtain reproducible images or to quantify results from a vast array of samples. To provide optimum flexibility when operating SU1510, the system can be connected to various peripheral devices, such as CRT and LCD displays, which enable integration with dedicated software packages and other components. Furthermore, the X-Y stage provides excellent movement and stabilization - essential for accurate imaging of even the most delicate samples. These features, alongside the possibility of linking peripheral devices, allow for a wide range of applications and make HITACHI SU-1510 an extremely valuable tool for students, educators, and researchers alike. It is the perfect tool for gathering advanced data from complex materials and specimens.