Used HITACHI SU-1510 #9276230 for sale

HITACHI SU-1510 Scanning Electron Microscope is a powerful imaging tool that can be used to examine the microstructure of samples with a high level of detail. The equipment is designed to provide high-resolution images of samples ranging from 10 nm to 1000 nm in size. The microscope features a field emission gun source for the electron beam with a Schottky emitter that can reach up to 300kV with a current of 30mA. With an accelerating voltage of only 15 kV, the system produces an extremely low-energy electron beam that reduces beam damage to samples and increases resolution. The microscope also uses a state-of-the-art electron optics, including electron condenser lenses, electron objective lenses, and a scanning deflector that allows for efficient beam scanning and digital imaging. HITACHI SU1510 is equipped with a range of detectors and cameras to capture images with superior contrast and resolution. Examples include secondary electron detectors, backscattered electron detectors, and a combined STEM detector. In addition, the optic unit includes various high-sensitivity display modes, such as secondary electron contrast, backscattered electron contrast, variable-beam contrast, and diffracted electron contrast. The microscope is equipped with an automated sample generator, allowing for easy and precise sample preparation. It features an automated sample handling machine and a multi-stage sample holder that can accommodate samples ranging from 5 cm to 25 cm in size. The automated sample handler also provides automatic focus and sample alignment. The microscope also has a robust image processing and analysis suite that allows users to quickly and accurately analyze their images. SU 1510 Scanning Electron Microscope is an ideal imaging tool for researchers in the fields of biology, materials sciences, nanotechnology, and more. With its advanced electron optics, low energy electron beam, and automated sample handling capabilities, the tool can provide researchers with unprecedented data from their samples.