Used HITACHI SU-3500 #293662287 for sale

HITACHI SU-3500
ID: 293662287
Scanning Electron Microscope (SEM) Secondary electron detector Reflection electron detector Low vacuum secondary electron detector EDX (AMETEK Octane Plus) MC1000 Ion sputter.
HITACHI SU-3500 scanning electron microscope is a powerful instrument that provides a unique means of imaging biological and other types of specimens at both high magnifications and high resolution. It is a high-performance imaging equipment that features a high-resolution secondary electron (SE) signal, a highly-capable low angle SE signal, and the ability to capture high-contrast images of organic, inorganic, and biological specimens with an amazingly high level of detail. The electron gun of SU-3500 is capable of producing an electron beam with a 30kV energy potential, with which this microscope is capable of generating high resolution nano-scale images at magnifications of up to 10,000x. This system utilizes an advanced SE imaging detector that helps to capture real-time images of specimens with remarkable clarity and speed. The SE detector is mounted in a digital display unit that can be used to adjust the image brightness and contrast, helping to ensure that the highest levels of contrast and detail are available even in difficult viewing conditions. The machine also makes use of a low-angle SE signal, which enables the capture of two dimensional images of even the most complex samples. This low-angle option allows observation of fine features even in low-contrast materials, and is also particularly useful for imaging of minerals and metals. HITACHI SU-3500 scanning electron microscope also makes use of a beam control tool, which uses three operating modes: normal operating mode, intermediate operating mode, and ultra-scanning mode. This enables the user to select the most appropriate mode for the sample being studied and ensure maximum accuracy and quality of image. In addition, the asset also features a high resolution energy-dispersive X-ray (EDX) detector model, which allows the detection of specific elements in a specimen. This equipment utilizes a 5-kilovolt accelerating voltage, making it perfect for analysis of inorganic specimens. This EDX component allows for both composition and structural analysis of a sample, giving biologists and other scientists greater insight into the structure and composition of their specimens. Overall, SU-3500 Scanning Electron Microscope is an extremely powerful instrument designed to provide spectacularly detailed images of specimens at high magnifications. It is an invaluable tool for research and development, enabling scientists to view and analyze their samples with far greater accuracy and detail than ever before.
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