Used HITACHI SU-3500 #9351010 for sale

HITACHI SU-3500 scanning electron microscope is a specialized laboratory instrument designed for imaging, analysis, and characterization of a variety of materials. This "workhorse" of the scanning electron microscope (SEM) family provides a range of features and capabilities for high-resolution imaging, quantitative analysis, and elemental/morphological characterization. The device is equipped with a 200 kV field emission gun of the Schottky type, specially designed for high transmission through focal lenses and up to 200 kW power supply for higher ionization and analysis. The detector system uses highly sensitive secondary electron (SE) and back scattered electron (BSE) detectors to capture electrons with high resolution and sensitivity. SU-3500 employs an automated vacuum chamber to maintain high resolution imaging at higher magnifications. This chamber reduces air and environmental contamination of the imaging environment, ensuring a clean imaging process. Its automated dual alignment feature enables rapid imaging of delicate samples and simplifies sample preparation; additionally, it provides a fast and accurate calibration for beam alignment. For analysis, HITACHI SU-3500 provides automated particle profiling (APP), X-ray mapping, and chemical mapping to investigate topologies of materials. The APP feature supports automated particle and inclusion analysis of "black" and "white" materials. X-ray mapping enables elemental and differential characterization of regions of interest, while chemical mapping supports mixed material analysis. Furthermore, SU-3500 provides advanced imaging features such as digital image storage, image data capture and analysis, and an annotation feature. The latter enables the user to record specific details about samples and to review and note structural findings. The intuitive, user-friendly interface of HITACHI SU-3500 allows for easy operation, while the ergonomic design of the device reduces strain on the user's eyes and body. As such, SU-3500 scanning electron microscope is an ideal choice for imaging, analysis, and characterization of materials in research, industrial, and educational settings.