Used HITACHI SU-5000 #293670168 for sale
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ID: 293670168
Field Emission Scanning Electron Microscope (FE-SEM)
Schottky gun
Exchange chamber
Delmic Cathode Luminescence (CL) measurement addition
Integrated CL function included.
HITACHI SU-5000 is a scanning electron microscope (SEM) designed to produce high resolution images and detailed analysis of samples. It has a high level of functionality, providing users with the ability to perform a wide range of sample inspection. HITACHI SU5000 is equipped with a high-performance secondary electron detector that provides clear resolution on the sample surface. It also has an optional in-lens detector for collecting backscattered electrons to increase the signal-to-noise ratio. In addition, SU-5000 offers a variety of automated image capture options such as the automated point scan and the area scan functions. SU5000 operates under a vacuum and is capable of detecting particles as small as 10nm on samples at magnification levels up to 1,000,000x. It can also measure objects as small as 6 microns with 5nm resolution. Furthermore, the microscope is integrated with an advanced motorized sample stage, enabling smooth and accurate sample movement for imaging and analysis. HITACHI SU-5000 is optimized for a variety of materials including metals, plastics, pharmaceuticals, and biological samples. It also has a built-in automated background subtraction system to reduce any noise in the signal. Moreover, its advanced electronics and software provide precision control of image acquisition. In addition, HITACHI SU5000 offers a wide variety of software analysis tools including 3D reconstruction, particle analysis, and mapping. This allows for more precise and accurate sample characterization. The software also enables the application of several imaging techniques like conoscopic, topographic, and scanning diffusion imaging. SU-5000 is an invaluable tool for research in industry, manufacturing, and scientific laboratories. Its high resolution imaging capabilities, wide range of automated functions, and advanced software analysis tools make it a powerful instrument for analyzing materials and detecting minute particles.
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