Used HITACHI SU-70 #9049699 for sale

HITACHI SU-70 Scanning Electron Microscope (SEM) is a state-of-the-art imaging instrument that provides an unparalleled level of imaging quality and versatility. It is designed with advanced analytical capabilities, enabling the examination of samples from a wide range of materials. The SEM can be used to investigate various electronic properties in a detail and to analyze materials down to the atomic level. The SEM features a high level of resolution for imaging, characterized by its excellent image clarity and deep depth of field. An accurate image can be acquired quickly and easily, with digitization of all of the parameters including brightness, contrast, color, and more. The instrument also offers a wide range of image enhancements to bring out the fine details of a sample. The SEM also features a broad range of energy capabilities, allowing for the study of materials over a large range of energies. This energy coverage from very low to high makes it suitable for a variety of applications such as surface analysis, crystallography, secondary electron imaging, and Auger electron spectroscopy. The system has several automated features, such as image stitching, that allow for further analysis. At the core of the system is a high-resolution Schottky field emission electron source. This source is highly stable and generates a narrow electron beam with a low spot size, allowing for a high level of clarity and resolution. The SEM allows for up to 20 kV of acceleration voltage, allowing users to accurately analyze a variety of samples. HITACHI SU70 is capable of acquiring data for quantitative analysis of the sample, with options such as elemental analysis. High-resolution images can be acquired using EDX detectors, allowing for detailed analysis of various elements and compounds. Additionally, the SEM features an automated back-scatter detector, making it perfect for the examination of topography. The instrument is designed for ease of use, featuring easy-to-navigate menus and intuitive software. The user can quickly navigate the menus to select the desired image parameters and begin imaging quickly. The SEM also features advanced software analysis packages such as Auto-Focus capabilities to help identify relevant features and a powerful image analysis package that allows users to manipulate images. In conclusion, SU 70 Scanning Electron Microscope is a powerful and feature-rich instrument. It offers a high-resolution imaging, energy coverage for a variety of sample types, wide range of automated features, and intuitive software. With its ability to image down to the atomic level, the system is a valuable tool for examining and analyzing a variety of materials.