Used HITACHI SU-70 #9227448 for sale

HITACHI SU-70 is a high resolution scanning electron microscope (SEM) that provides exceptional performance and image quality. The optical system is composed of two identical electrostatic objective lenses which enable the simultaneous observation of both secondary and backscattered electrons. These lenses allow high resolution imaging while maintaining a compact size. The SEM has a chamber that can be manipulated to accommodate a large variety of samples. This allows the user to accurately adjust the focus and magnification. The microscope also has a field emission gun (FEG) which allows the user to adjust the energy of the electrons in order to observe surface features and analyse the composition of samples. The gun is able to provide up to 3,000V accelerating voltage which enables the study of samples of non-conductive materials with a wide variety of electron energies. The FEG is also capable of providing low kV SEM imaging of non-conductive materials with a contrast resolution of up to 1nm or 0.1nm. The SEM has a unique system of use interface (U.I.) which is designed to allow easy operation. The user can select either the English or Japanese language with a graphical user interface for making adjustments to the settings and parameters of the microscope. For enhanced operation, the microscope is bundled with dedicated software that can assist with the setting of the parameters and image acquisition. Finally, the microscope is equipped with a range of accessories including specimen holders, specialised stages and polarised filters which helps the user to optimise the imaging process. The combination of the various features provides the user with an accurate and high performance SEM.