Used HITACHI SU-8010 #293824832 for sale

HITACHI SU-8010 is a scanning electron microscope (SEM) renowned for its advanced imaging capabilities. It offers state-of-the-art features including improved resolution, excellent high-speed scanning and precise analytical capabilities. With its high vacuum chamber, HITACHI SU8010 is capable of a wide range of imaging applications, from basic failure analysis to advanced research pursuits. SU 8010 incorporates a multi-axis scan system with a maximum scan rate of 1.0 sec/line (with a line pitch of 1.0 µm). This facilitates fast, responsive imaging with minimal time lag. The 4000 x 3000 pixel CCD camera provides an incredibly high image resolution of 2-3 nm. This allows the microscope to capture the finest details of a sample, while maintaining excellent contrast. In addition, the simultaneous analog-digital acquisition of the camera provides low noise levels, resulting in images of unparalleled clarity and detail. SU-8010 provides a variety of analytical capabilities as well. It is equipped with a Oxford EDS system, which allows elemental mapping of a sample in a variety of modes. The microscope is also configured with an adjustable autofocus sensor for sample preparation. This allows users to easily adjust the sample height for optimal imaging. Finally, SU8010 offers exceptional user-friendliness. It is equipped with a control panel that simplifies operation, and its enhanced graphical user interface allows users to configure settings with minimal effort. The microscope is also compatible with a range of sample holders, making it suitable for various types of research. Overall, HITACHI SU 8010 is an exceptional scanning electron microscope, offering top-of-the-line features and superior imaging capabilities. It is ideal for a variety of applications, from basic failure analysis to advanced research pursuits. With its state-of-the-art design and advanced analytical capabilities, HITACHI SU-8010 is the perfect tool for anyone looking to explore the intricate details of a sample in remarkable detail.