Used HITACHI SU-8010 #9208800 for sale

HITACHI SU-8010 is a scanning electron microscope (SEM) that provides excellent technical capabilities and a wide range of features. The equipment is equipped with state-of-the-art scanning electron optics, which allow for highly detailed images of objects down to a size of 0.5nm. In addition, it is also capable of taking analytically relevant images from non-conductive samples by the use of its cryo field emission electron source with a long service life. It is conveniently operated by a powerful digital controller, which supports automatic scanning and a range of additional features, such as ultra-large area imaging kits and dedicated environmental SEM chambers. The system is equally well suited for both routine and advanced applications thanks to its wide range of equipments and functions. The integrated energy dispersive X-ray detector (EDS) allows the user to identify and analyze sample compositions with ease. In addition, HITACHI vacuum unit facilitates both ultra-high vacuum (UHV) for elemental imaging and a range of gases to assist in research studies. HITACHI SU8010 also features a high transmission electron imaging (HTEM) mode, which makes it possible to observe real-time, in-situ imaging of dynamic phenomena. Moreover, the machine has an advanced sample stage which is composed of a 5-axis micro/nano probe stage, a large sample chamber, and specialized cryo stages for samples requiring low temperature conditions. The tool can also be equipped with a variety of accessories such as a sample heating asset, a low vacuum transfer model, an advanced acceleration and deceleration technology, and a new automatic alignment equipment which are all useful for the imaging of difficult samples. Last but not least, the system is equipped with an AES detector, which is capable of providing high-contrast elemental imaging of magnetic/ non-magnetic materials including liquid or powder samples. With this feature, researchers can gain insight into individual atomic structure without the need of dedicated sample preparation. All these features make SU 8010 a great scanning electron microscope for precise imaging and elemental identification.