Used HITACHI SU-8010 #9268652 for sale

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ID: 9268652
Vintage: 2014
Scanning Electron Microscope (SEM) SE-BSE EBIC KLEINDIEK X2 Probes BRUKER EDX 6/60 2014 vintage.
HITACHI SU-8010 scanning electron microscope (SEM) is a versatile four-gun variable pressure field emission SEM equipment with high performance. It combines the latest advances in field emission source technology and electron optics to produce high resolution and high quality images for a broad range of materials. HITACHI SU8010 features a specially designed four-gun field emission source consisting of the conventional three gun setting, plus a special fourth gun design to give a high current and maximum acceleration voltage, while maintaining a stable field emission current and long working life. The four-gun field emission source uses a primary-directional-electron optical system, which reduces spherical aberration, producing high resolution images. The SEM offers a wide range of magnification up to 6,000x and can accommodate up to four samples at the same time allowing for simultaneous comparison and high-quality imaging of multiple materials. The total sample chamber pressure can be adjusted between 0.5-60 Pa, and features a plug-in gas mixing unit for high-resolution imaging of different samples in different gases. SU 8010 is equipped with a high-speed scanning machine which ensures a large and wide scan size, providing scanning coverage of a large area. It also includes a standard built-in superior secondary electron detector to offer clear images on samples with thin or transparent layers. A unique cooling tool inside the SEM reduces spurious noise, giving enhanced stability and uniformity, extremely fast scanning, and produces sharp and accurate images. A high-resolution TEM/STEM (Transmission Electron Microscope/Scanning Transmission Electron Microscope) compatible gun-filament heat load operation is also available. The imaging software package provides automatic image optimization tools, further easing image analysis and helping you quickly capture meaningful results. In addition, it comes with an efficient imaging manipulation package, including 3D imaging and analysis capabilities. The variable pressure field emission SEM asset of SU8010 is highly versatile, providing superior imaging in a wide range of experimental conditions. It is your ideal instrument for high-resolution imaging of different materials and morphological analysis.
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