Used HITACHI SU-8010 #9412046 for sale

HITACHI SU-8010 is a scanning electron microscope (SEM) designed to quickly and accurately acquire detailed morphological data of a wide sample of materials at sub-micron resolution. The design and construction of the microscope are optimized to produce high-resolution, high-contrast images of materials ranging from biological specimens to powder samples. The large depth of field allows for precise imaging of samples with a variety of sample shapes, sizes and orientations. HITACHI SU8010 is equipped with a field emission gun (FEG) source that provides stable and reliable electron beam current. This FEG source is capable of producing an electron beam with low energy spread and high brightness. The electron beam is focused and scan formed optically by an optimized Einzel lens equipment in order to improve resolution and contrast. The microscope also utilizes a sophisticated CCD camera system with proprietary image processing technologies to yield high-quality digital images with excellent resolution and high contrast. The SEM is designed with a sophisticated sample holder unit. The holder can accommodate up to 3 samples at once and can also be used to carry out simultaneous imaging of multiple samples with different beam current and acceleration voltage settings. This enables the user to improve the signal to noise ratio of images taken. An optical image can also be taken with SU 8010. This is accomplished using a high-pressure scintillator that converges the vacuum emitted secondary electrons into a video signal that is captured by the CCD camera. This allows the user to observe the specimen before and after scanning it with the electron beam. The mechanical construction of the SEM is optimized for stability and reliability. Piezo-driven X-Y stages are utilized to allow for precise navigation of samples with ease. The precision control in navigation is achieved with open-loop control theory, and the microscope is equipped with a four-axis joystick that allows for synchronized movement in real-time. SU8010 is a sophisticated scanning electron microscope designed to offer researchers and technicians a reliable and accurate tool for investigating a variety of samples. The high resolution, high contrast images obtained by the microscope can provide insight into a material's structure and morphology. The advanced sample holder machine, mechanical design and CCD camera tool allows the user to capture accurate images quickly and easily.