Used HITACHI SU-8010 #9412309 for sale

HITACHI SU-8010 is a scanning electron microscope (SEM) designed for the observation of surfaces and the structure of materials. It features an energy dispersive spectrometer (EDS) and a large work chamber with a high pressure air-lock. The SEM utilizes an electron beam to generate images with a resolution down to 0.5 nm, allowing for detailed examination and analysis of surface features and microstructures. HITACHI SU8010 features a large 21 cm diameter work chamber with a vibration suppression mechanism and a robust high-pressure air-lock. The air-lock allows sample transfer without contamination, and the vacuum connection can be disconnected to isolate the work chamber from the vacuum system. The SEM has a sample stage that can accommodate a wide range of sample sizes and shapes. The SEM is equipped with a field emission gun (FEG) electron source and a thermoionic detector for the secondary electrons. Electron current can be adjusted from 1 pA to 10 nA, allowing for a wide range of samples and conditions. The electron beam can be deflected for wide area observation and for spot size reduction. SU 8010 also has an energy dispersive spectrometer (EDS) for chemical analysis of surfaces. The EDS has a silicon surface barrier detector (SSD) with a large solid angle, allowing for rapid and accurate elemental analysis. The system has additional features, such as automatic gain control, multichannel X-ray windowing and pulse pileup rejection, which provide ample flexibility for various experimental needs. The SEM is equipped with an image processor for real-time processing of microscope images. The processor can combine images and perform morphological analysis, helping to draw accurate conclusions and detailed reconstructions. The system also has a variety of interfaces, including a parallel port, RS-232 and IEEE1394, allowing easy connection to various computer systems. SU8010 is a versatile and powerful scanning electron microscope, designed to meet a wide range of application needs. It features a robust design and construction and offers a superior imaging and analysis capability, suited for high-resolution observations of solid surfaces.