Used HITACHI SU-9000 #9250542 for sale

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ID: 9250542
Wafer Size: 12"
Vintage: 2011
Field Emission Scanning Electron Microscope (FE-SEM), 12" Immersion lens SE Resolution: 1.2 nm at 1 keV SE Resolution: 0.4 nm at 30 keV Hyper stage Combined operation: Joystick and trackball Full operation: Control panel Standard specimen holder EDS Ready (DBC And RS-232C interface) Anti-contamination unit Dry vacuum system Wide screen flat panel: 24.1" UL/SEMI Compliance Environmental enclosure Control unit for double tilt holder HASKRIS Air-cooled water recirculator AZTEC Energy standard micro-analysis system With X-MaxN 80 large area analytical upgraded Hardware includes: X-MaxN 80 SDD Detector with PentaFET precision Active area: 80 mm² Resolution guaranteed on Mn K - 127 eV at 50,000 cps SATW Windows for detection of elements from beryllium MicsF+ Microscope image capture system X-Stream 2 micro-analytical pulse processor PC Operating system: Windows 7 Widescreen LCD display, 23" BF/DF Duo-STEM detector: Includes specimen holder for BF / DF STEM image BF-STEM / Detection angle control DF-STEM BF APT Unit YAG BSE Detecting unit Top detecting device Video amplifier unit: 2 Channels for YAG / STEM Photomultiplier power supply unit: 2 Channels for YAG / STEM Cross section specimen holder: Specimen size (L x H x W): 12 mm x 2 mm x 6 mm Double tilt cross section holder: ±15° 2011 vintage.
HITACHI SU-9000 is a next-generation scanning electron microscope (SEM) that offers unparalleled precision and imaging quality for a variety of scientific disciplines. This high-performance SEM provides ultra-precise resolution up to two nanometers, allowing users to examine highly detailed structures in minute detail without sacrificing image quality. The novel electron gun design paired with the field emissions source offers increased stability, enhancing imaging resolution and consistency. The dedicated 'X-ray Microanalysis' mode allows researchers to isolate and characterize various elements within a sample, offering unique insights into a sample's chemical makeup. SU-9000 also features an automated stage with a range of motion up to 50 x 50 millimeters. This system has automated positioning accuracy within 0.1 microns for precise sample positioning. Along with a tilt angle range of ± 70°, researchers can capture multiple views, providing a more comprehensive, detailed overview of the sample without sacrificing accuracy. An automated specimen loader is also available to streamline sample exchange and capture process. Additionally, HITACHI SU-9000 offers innovative observation modes such as 'Single-Point Spectral Measurement', allowing users to quickly and accurately determine the elemental composition of a sample without the need for any additional equipment. The electron beam current control means even greater accuracy and reliable elemental analysis. The powerful imaging software boasts a range of imaging features, including Dual Beam Imaging, Stereoscopic Imaging and Image-Analysis programs. These features enable versatile analysis, visualization, and reporting in real-time. The software also has 3D tomography reconstruction, allowing for imaging in three-dimensions for superior data visualization, enhanced analysis and high-resolution 3D image acquisition. Finally, SU-9000 includes HYPERVISO, a unique, Lithium-ion energy-saving power supply system. This advanced cooling-and-switching technology vastly reduces electricity usage while maintaining precision. This is especially beneficial for research institutions and businesses that need to remain budget-conscious. All these features combined make HITACHI SU-9000 an invaluable tool in the investigation and characterization of nano materials and other nanoscale structures. With improved imaging quality, precision and versatility, SU-9000 is an essential tool for any research laboratory focused on nanomaterials or imaging on a sub-micron scale. With its low cost-per-sample, comprehensive feature set and advanced analysis technologies, HITACHI SU-9000 is the perfect choice for a lifetime of groundbreaking research.
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