Used HITACHI SU-9000 #9266073 for sale

HITACHI SU-9000
ID: 9266073
Vintage: 2015
Scanning Electron Microscope (SEM) 2015 vintage.
HITACHI SU-9000 is a field emission scanning electron microscope (FE-SEM) that provides superior performance for imaging and analysis. Equipped with advanced technology, the microscope offers a variety of features, such as a large chamber, high-performance chamber, and brighter electron source, which make it especially suitable for a wide range of imaging, analysis, and metrology requirements. This high-end microscope has an inferior vacuum chamber, improved optics, and faster electron gun assembly. It also is equipped with an ultra-high vacuum equipment that provides an optimal environment for imaging. As compared to other SEMs,the microscope's chamber is larger at 1,000 cubic millimeters, which allows an increased working distance between the specimen and electron source. SU-9000 also features an improved electron source, which produces a brighter beam than the traditional SEMs due to its integrated Cs-extraction lenses. The brighter beam helps to reduce the imaging time and improve the resolution of the images. In addition to its electron optics, HITACHI SU-9000 also has a secondary electron detector with a superior field of view and a high-performance energy detector, both of which make it easier to measure composition, thickness, and contours. The energy detector also has a high accuracy level and can detect a wide range of materials. The microscope has various features that make it ideal for metrology applications. It comes with a scan speed of 0.23 to 7.75 Hz and up to 600 μm/sec. Additionally, SU-9000 has a built-in Particle Image Velocimetry (PIV) system, which is used to measure material properties. HITACHI SU-9000 has a unique design for user interface, which includes a sample mount and environmental control unit. The sample mount allows for easy operations, and it can be used for measurements and inspections. The environmental control machine is user friendly and helps maintain the low-vacuum environment inside the chamber. The microscope is supported by a complete range of accessories, such as a heating and cooling tool, which is used to maintain sample temperature during imaging. It also has a filtration asset, which is designed to reduce the number of particulates in the chamber, and a data acquisition model, which can store and transfer data to network storage. Overall, SU-9000 is a high-end, field emission FE-SEM that provides superior imaging and analysis capabilities. It has an advanced chamber, improved electron source, and state-of-the-art metrology features, which make it an excellent choice for a variety of industrial and research applications.
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