Used HITACHI TM-3000 #293775942 for sale
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ID: 293775942
Vintage: 2011
Tabletop Scanning Electron Microscope (SEM), parts system
P/N: 55E-0030
Top cover non-functional
2011 vintage.
HITACHI TM-3000 Scanning Electron Microscope (SEM) is a powerful analytical tool designed for material analysis and monitoring. It is used to create high-resolution images, elemental and chemical analysis of specimens and perform microstructural analysis. HITACHI TM3000 is a versatile tool that can handle a range of samples and is used by scientific research and industrial institutions worldwide. TM 3000 is a fully-featured SEM, offering superior imaging and analysis capabilities. Its unique design and construction make it an effective and reliable SEM for a variety of applications. The instrument is equipped with a high magnification column - capable of up to 150,000x - and a large field of view to maximize the visibility of fine microstructural and chemical details. Additionally, TM-3000 is equipped with advanced features such as a digital imaging equipment, built-in EDS detector, a gas inlet system, and a micro-manipulator. The EDS detector allows for energy dispersive elemental and chemical analysis of specimens, while the gas inlet unit allows for visualization of ultra-vacuum processes within a sample. The micro-manipulator enables samples to be manipulated during observation or TEM sample preparation. HITACHI TM 3000 is a reliable tool for industry and research, equipped with a low-vibration environment to ensure smooth imaging and analysis. It is also supported by an intuitive and highly customizable operating machine that allows users to tailor their workflows based on their needs. In addition, the instrument can be expanded with a variety of secondary systems such as an auto-focusing tool and an X-ray diffraction asset. For industrial and research applications, TM3000 offers powerful analysis capabilities, breath-taking images, and robust sample support. In the years following its introduction, HITACHI TM-3000 has become the go-to choice for material analysis and monitoring around the world.
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