Used HITACHI TM-3030 Plus #293779279 for sale

ID: 293779279
Vintage: 2017
Tabletop Scanning Electron Microscope (SEM) Magnification range: 20000x Secondary Electron Detector (SED) Backscattered Electron Detector (BSE) EDS Diaphragm pump Vacuum system Operating system: Windows 7 2017 vintage.
HITACHI TM-3030 Plus is a scanning electron microscope (SEM) designed to provide up to 30,000x magnification for routine samples, and 50,000x magnification to obtain the highest resolution images in circuit research or failure analysis. With its advanced control capabilities, TM-3030 Plus is a premier high-end imaging solution. HITACHI TM-3030 Plus has a high-contrast and high-luminance surveillance camera able to capture images using both brightfield and backscattered electron detection, as well as secondary electrons and fluorescent X-rays. Its built-in image processing capabilities allow users to adjust image settings such as threshold, contrast, and gamma. The highest resolution of digital images is ensured by TM-3030 Plus' advanced projection, illuminating the specimens with a high-energy beam of electrons. This is strengthened with the microscope's variable pressure and secondary electron suppression technology, which ensures the electrons' ability to penetrate beneath the surface of the sample and take high-resolution cross-sectional imaging. HITACHI TM-3030 Plus comes with a touch control panel, automated sample changer and an integrated optical microscope. It features variable stage-tilt and back-focus controls, which allow precise image adjustment. It also has an integrated, multi-axis motorised stage for 3-D imaging as well as an advanced 12-bit digital signal processor and stage scanner for making automated images. TM-3030 Plus is a powerful, versatile microscope capable of providing a wide range of information for a variety of research and industrial applications. It uses a unique combination of SEM and EDX analysis to generate accurate and detailed images, ensuring accurate data and reliable results. Its precision and performance make it an ideal choice for failure analysis, metallurgical research, semiconductor manufacturing, and circuit research applications. With its ability to quickly scan samples for high-resolution images, HITACHI TM-3030 Plus enables the rapid acquisition of valuable data.
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