Used HITACHI TM-3030 Plus #293830102 for sale
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ID: 293830102
Tabletop Scanning Electron Microscope (SEM)
OXFORD EDS
DEBEN CL Detector.
HITACHI TM-3030 Plus Scanning Electron Microscope (SEM) is a precision instrument used to observe the surface of a specimen. It utilizes a beam of electrons to create a magnified image of a sample, allowing researchers to gain detailed insight into its makeup. TM-3030 Plus features a newly-developed high-performance, high-stability optical design, allowing for clear images with minimal distortions. The instrument also features a high-sensitivity SE detector, which is essential for high-resolution imaging. In terms of its operational performance, HITACHI TM-3030 Plus is capable of magnifications ranging from 40X to 30 000X. The instrument also has a working distance range of 91mm to 396mm. Operators can rotate their samples up to +/- 70° in the X- and Y-axes, and the instrument also has an inclined stage for more precise observation. In addition, the instrument is equipped with a range of image analysis functions designed to streamline laboratory workflows. These include automated feature recognition, image enhancement, and feature extraction, which allows for quick and easy characterization. TM-3030 Plus has a built-in auto-focus feature and auto-stigamtism correction, allowing for stable imaging even when faced with mounting irregularities. The instrument also includes a powerful autointegrator which eliminates the need for manual data collection and analysis. Overall, HITACHI TM-3030 Plus is a reliable and versatile scanning electron microscope that is well suited for laboratories in need of high-resolution imaging and analysis. The instrument's advanced imaging and data analysis capabilities make it an ideal tool for researchers looking to gain an in-depth understanding of their samples.
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