Used HITACHI TM-3030 #293831148 for sale
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ID: 293831148
Vintage: 2010
Tabletop Scanning Electron Microscope (SEM)
Magnification: 15x ~ 30,000x (digital zoom: 2x, 4x)
Observation condition: Surface / normal / high brightness
Observation mode: Standard mode / charge reduction mode
Image mode: Standard / shadow 1 / shadow 2 / topography (concave - convex)
Specimen travel range: X: ± 17.5mm, Y: ± 17.5mm
Electron source: Pre-centered cartridge filament
Detection system: High-sensitivity 4-segment semiconductor
Auto image: Auto-start / Auto-focus / Auto-brightness
Image format: BMP, TIFF, JPEG
Protection function: Overcurrent protection function
Room temperature: 15~30℃ (at = within ±2.5℃/h)
Humidity: 45%~70% RH
Acceleration voltage: 5kV / 15kV
PC power supply: Single-phase AC100V, 50 / 60Hz
Main unit power supply: Single-phase AC100~240V, 50 / 60Hz, 500VA
2010 vintage.
HITACHI TM-3030 is a versatile tabletop scanning electron microscope (SEM) that incorporates advanced imaging technology in a compact design suited for a wide range of applications. With its high resolution imaging capabilities and user-friendly interface, TM-3030 provides researchers, engineers, and educators with an effective tool for observing microstructures and analyzing samples at a microscopic level. At the core of HITACHI TM-3030 is its electron optics system, which includes a tungsten thermionic source that generates a focused electron beam for imaging. This electron beam is controlled and scanned across the sample surface using electromagnetic lenses and scanning coils, allowing for precise imaging and analysis of samples with magnifications ranging from 15x to 30,000x. TM-3030 is capable of providing high-resolution images with a minimum resolution of 5 nanometers, enabling users to observe fine details and microstructures with exceptional clarity. HITACHI TM-3030 features a large chamber that accommodates samples of various sizes, making it suitable for a wide range of applications across different fields, including materials science, biology, geology, and more. The chamber is equipped with multiple detectors, including secondary electron detectors and backscattered electron detectors, which allow for the collection of different types of signals and imaging modes to enhance sample analysis capabilities. One of the key advantages of TM-3030 is its ease of use and intuitive user interface. The microscope is equipped with a dedicated control panel and software interface that streamline the imaging process, making it accessible to both novice users and experienced researchers. The software allows users to control imaging parameters, adjust contrast and brightness, and capture images with a simple click of a button, facilitating efficient sample analysis and data acquisition. HITACHI TM-3030 also features intelligent functions such as automatic focusing and astigmatism correction, which optimize imaging performance and ensure high-quality results. These functions help users achieve sharp, focused images quickly and consistently, enhancing productivity and efficiency in the laboratory setting. Furthermore, TM-3030 is equipped with advanced analytical capabilities, including energy-dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) options. These analytical techniques enable users to obtain elemental composition information and crystallographic data from samples, expanding the microscope's capabilities for material characterization and research. In summary, HITACHI TM-3030 is a powerful tabletop scanning electron microscope that offers high-resolution imaging, versatile sample analysis capabilities, and user-friendly operation in a compact and efficient design. With its advanced features and intuitive interface, TM-3030 is an ideal tool for a wide range of applications in research, industry, and education, allowing users to explore and analyze microstructures with precision and clarity.
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