Used HITACHI WA 1200 #9196442 for sale

HITACHI WA 1200
ID: 9196442
Atomic Force Microscope (AFM).
HITACHI WA 1200 scanning electron microscope (SEM) is an advanced analytical instrument capable of producing high-resolution images and microanalysis. The instrument features an in-column secondary electron detector which enables high contrast and excellent image depth, as well as an UltraHigh Vacuum system, and state-of-the-art electron optics. The instrument operates with an accelerating voltage of up to 30kV and is capable of imaging samples with a resolution of up to 50 nanometers. It utilizes a range of detectors to increase the information that can be derived from a sample, including an in-column Secondary Electron Detector, Backscattered Electron Detector, and three-dimensional Electron Spectrometer. HITACHI WA-1200 also includes a wide range of user-friendly features. It is equipped with a fully automated stage that allows for precision sample placement, while two sample holders are provided to ensure quick sample loading and unloading. It boasts a high-speed stage travel of 50mm/sec, while it is also able to obtain digital images without film processing. The instrument also includes a range of imaging and analysis software options which can be used to manipulate and analyze the images produced. The software has a variety of features such as image contrast manipulation and image-processing, as well as drawing and measurement functions. The software is also capable of producing 3D images from data collected from multiple fields of view. In addition, WA 1200 can be used with a variety of add-on accessories such as an Automated Focused Ion Beam (AFIB) or a Variable Pressure Beam (VPB). The AFIB allows for the imaging of extremely small features with an accuracy of nanometers, while the VPB allows for a small work area, and can be used for examining delicate samples. Overall, WA-1200 Scanning Electron Microscope is an excellent instrument, capable of producing high-resolution images and completing detailed microanalysis. It features advanced electron optics, a range of user-friendly features, and software capable of producing sophisticated images and analysis. In addition, accessories can be added to provide further functionality.
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