Used HITACHI WA 3300 #293609265 for sale

HITACHI WA 3300 is a Field-Emission Scanning Electron Microscope (FE-SEM) that uses a focused electron beam to obtain images of a variety of materials at resolutions in the nanometer range. It is an ideal tool for studying surfaces, interfaces, composition and structure of materials down to the nano-scale. HITACHI WA3300's design is based off of the high-performance achromatic in-lens system, which minimizes astigmatism of the electron beam and provides a higher resolution and imaging flexibility for a wide range of materials and applications. The in-lens design also provides a large depth of field, including the ability to image both hard and soft materials. WA-3300 features an enhanced electron beam column with a dual-stage gun, providing improved stability and greater high-resolution imaging capabilities. The high-output electron gun is designed for a filament in both 'cold' and 'warm' modes, enabling it to reach an acceleration voltage up to 30kV. This allows the user to obtain nanometer resolution imaging, even in the high vacuum environment. HITACHI WA-3300 also includes an in-column-illuminated SE/BSE detector and an in-column Faraday cup for low kV imaging applications. All of these features make WA 3300 an ideal system for applications including thin film analysis, interfaces, depth profiling and a variety of other materials characterization techniques. Additionally, WA3300 comes with a host of accessories including an SEM Substage and STEM/HRTEM Accessory options, and secondary electron and backscattered electron detectors. HITACHI WA 3300 is also compatible with a variety of vacuum pumps and other peripheral devices, such as automatic sample changers, allowing for a more flexible and automated operation. HITACHI WA3300 is a powerful instrument that provides accurate, high resolution images and easy to use operation. With its unique in-lens design, and wide range of detectors and accessories, WA-3300 makes it an ideal choice for materials and surface analysis.