Used HITACHI WA 3300 #9240766 for sale

HITACHI WA 3300 Scanning Electron Microscope (SEM) is a powerful tool for imaging and analysis of materials and surfaces at high magnification and with high spatial resolution. This SEM features easy operation with an intuitive user interface, as well as a variety of high performance features that make it suitable for a wide array of applications. HITACHI WA3300 is equipped with a high-performance tungsten filament electron source that is capable of producing a robust electron emission with excellent brightness and stability. This ensures images of the highest quality every time. WA-3300 is equipped with high-magnification system, allowing operators to image features down to 5nm in size. Its advanced imaging technology and advanced electronics can also be used to enhance the images, revealing delicate surface features and providing the ability to accurately measure and analyze the sample at a nanoscale. WA 3300 also features a powerful filtering and contrast enhancement system that allows better visualization of contrast we find in high magnifications. The optical components in HITACHI WA-3300 SEM have a high level of stability and are designed to remain in good alignment over time. The scan stages also have a high level of accuracy and feature a built-in positioning accuracy of 0.2mm or better. This allows for precise scanning and focus control, even at high magnifications. WA3300 also contains a wide range of detectors. These include BSE detector, SE detector, and backscattered electron detector. Additionally, HITACHI WA 3300 can be fitted with a wide range of optical elements, including a co-axial light, a back lens, and a dark field lens. These components can be used to carry out investigations of surface features and composition. In addition to providing superior image quality, HITACHI WA3300 also contains a number of safety features. These include a remote shut down capability and protection against excessive levels of electron radiation. WA-3300 also features an adjustable camera stand and its own computer, allowing for remote control and data-logging of the SEM's activities. WA 3300 is an advanced scanning electron microscope that provides powerful imaging and analysis functions, a high level of accuracy and stability, and a wide range of detectors and optical components for enhanced performance. This flexibility and reliability provide HITACHI WA-3300 with the capability to meet the needs of a wide range of laboratory and industrial applications.