Used HITACHI WB-3000 #293643011 for sale

HITACHI WB-3000 is a scanning electron microscope (SEM) that offers powerful analytical capabilities combined with convenience and ease of use. It is a covering a wide range of applications for research in life sciences, materials, and industry. The device is equipped with a high-resolution cold field-emission electron source and a dedicated image processor that allow for outstanding image quality, from the basics of morphological observation to the more advanced investigations of structure-property relationships. In addition, the electronic unit offers users the possibility to work with DualBeam™ technology. This advanced feature combines SEM imaging with simultaneous Focused Ion Beam Milling (FIB-SEM) for nanofabrication. WB-3000 features a multi-mode filter system that offers the best possible resolution and sensitivity, while minimizing charging and the risk of damaging samples due to electron irradiation. The MultiMode™ detector allows the user to switch electron detection modes depending on their particular application needs. The system also incorporates a wide range of automation features that allow users to accurately control the SEM operation to best analyze the samples. It is equipped with a Probe Sensor Controller that ensures the best possible conditions for controlling substrate air bearing. The user can program the sample stage to enable fully automatic measurement and capture of data. The design also allows easy transport of specimens between the sample manipulation tools, such as the SEM and the CLEM chamber, with the possibility of quickly exchanging the chamber for specialized applications. HITACHI WB-3000 is highly suitable for more advanced tasks in material and life sciences research, for example, due to its high analytical performance. With the use of EDAX® software, the device is able to offer users reliable and accurate elemental and chemical analysis. Additionally, the ES-1000 external specimen holder paired with WB-3000 enables users to analyze specimens not only in the vacuum chamber but also in other atmospheres. The device also supports EBSD and CL analyses, which allow for accurate observations and measurements of the surface information. In conclusion, HITACHI WB-3000 scanning electron microscope is a powerful analytical tool that offers impressive performance and features, combined with user-friendliness and remarkable practicality. By combining high-resolution Cold Field Emission Electron source with the MultiMode™ filter system and versatile controller features, the device enables users to accurately observe, analyze and capture data from various samples and fields.