Used HITACHI WB-3100 #293643008 for sale
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ID: 293643008
Wafer Size: 8"
Vintage: 2004
Wafer bump inspection system, 8"
2004 vintage.
HITACHI WB-3100 is a scanning electron microscope (SEM) with a wide range of capabilities for advanced microscopy. It includes an SEM imaging equipment, an electron backscatter diffraction (EBSD) detector, a field-emission source, and a range of imaging and detection technologies. Its advanced features allow it to make accurate high-resolution images of samples with a wide range of features. WB-3100's electron source uses a field-emission gun which is capable of a wide range of energy resolutions and gives high performance. The system has an imaging current of approximately 200 nA to 100 nA, allowing for a good resolution of images. The wide range of gun energies mean better imaging of different kinds of materials. The unit is also equipped with a high-resolution detector in the form of a high-definition camera. This allows for better image resolution and contrast, and the ability to detect finer details in the sample. HITACHI WB-3100's EBSD detector provides highly precise electron diffraction analysis of samples. This allows for the evaluation of complex crystal structures and information about their chemistry. The EBSD detector can also be used for strain measurements, elemental analysis, and other advanced imaging capabilities. The SEM unit also has a broad range of additional features. These include a 5-axis stage, electron imaging machine, and a range of imaging and detection technologies. The 5-axis stage allows for accurate positioning of the sample, while the electron imaging tool allows for a range of imaging techniques, such as secondary electron and backscattered electron imaging. The imaging and detection technologies allow for a wide range of analyses and measurements, including surface topography, elemental mapping, and X-ray mapping. WB-3100 is an advanced scanning electron microscope asset with a range of features. Its field-emission electron source, high-resolution camera, and EBSD detector provide high-resolution imaging of a range of features. The 5-axis stage and imaging and detection technologies allow for a wide range of analyses and measurements. With these capabilities, HITACHI WB-3100 is a powerful tool for advanced microscopy and analysis.
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