Used HITACHI WB-3100 #9273090 for sale

HITACHI WB-3100
ID: 9273090
Wafer bump inspection system.
HITACHI WB-3100 is a scanning electron microscope (SEM) that is used for high-precision imaging with advanced analyses capabilities. This microscope has a high resolution of 1 nm, making it ideal for imaging and examining microstructures with great detail. It is equipped with a large liquid nitrogen cold stage that allows for operation at temperatures down to -196 ºC and vacuum conditions of 1 x 10-6 Torr. WB-3100 has a high-precision XYZ stage that is ideal for precise positioning during imaging. This stage has diffraction optics and an on-axis mirror system which provides superior stability, allowing for high-resolution imaging of microstructures with a low speckle noise. The microscope also has a high-resolution deflector lens that allows for higher resolution image capture at larger magnifications. This SEM is capable of capturing and analyzing even small details, such as nanoparticles and films up to 5 nm thick. The microscope also has an impedance photometer that can detect electrons from metallic and non-metallic materials and samples with a high level of accuracy. Additionally, HITACHI WB-3100 is equipped with a variety of automated functions such as automated stage location, automated stage motion control, microscope area scanning, and automated measurement. This SEM has a user-friendly imaging software which allows for easy and efficient operation. It is also able to connect to external computers for data analysis and image storage. Overall, WB-3100 is an ideal choice for imaging and analyzing micro- and nano-structures with the highest level of precision. Its high resolution and automated features provide users with an optimal imaging and analysis experience.
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