Used HITACHI WB-3100 #9306147 for sale

HITACHI WB-3100 is an advanced scanning electron microscope (SEM) designed to combine high-resolution imaging and analysis of microscopic specimens. This instrument is capable of magnifying objects up to 150,000x at a resolution of 0.9 nm, potentially allowing for the single atom imaging of certain materials. It is equipped with an Active ESEM detector which results in significantly improved signal-to-noise ratios compared to traditional passive detectors, allowing for detailed imaging of samples with minimal noise. WB-3100 also features an "in-lens" type secondary electron detector which allows for enhanced mapping of sample surfaces. Coupled to this is an energy dispersive x-ray (EDX) detector that provides elemental analysis of the specimen's surface composition. Furthermore, the SEM is outfitted with an auto-focusing module that ensures consistent sample imaging over a wide range of magnifications. Specimens can be viewed in a non-vacuum environment, making HITACHI WB-3100 a suitable choice for non-magnetic and organic/biological sample imaging applications. Additionally, the instrument is capable of detecting invisible features such as ultratrace amounts of analytes, cellulose fibrils, and even individual viruses, allowing extensive qualitative and quantitative analysis at very high resolutions. One of the most impressive features of WB-3100 is its high-precision "omni-directional" stage. This stage allows for fine manipulation of the samples being observed, enabling researchers to focus on specific regions of interest during observation and analysis. Furthermore, the stage utilizes closed-loop control that enables accurate sample positioning with extremely high resolution (0.1 µm) and repeatability (0.02 µm). All these features combine to create an extremely versatile instrument for researchers and scientists to conduct cutting-edge microscopic observation and analysis of a wide range of specimens. This makes HITACHI WB-3100 the perfect choice for any laboratory that needs to observe and analyze microscopic materials with high resolution, accuracy, and repeatability.