Used HYPERVISION V 2000 #149304 for sale

ID: 149304
Backside emission analysis microscopy system Configuration: Probe system: SUSS MicroTec probe station and probe arm Chuck: 8" Automatic control plant TMC anti-vibration pad Microscope system: Objective lens: 5x, 20x, 50x CCD system PC system Power supply system Equipment performance requirement: Wavelength: 605 to 1060nm Installation requirements: Power: 220V ± 10%, 2A, 330W, 50/60Hz GN2: 80 to 100psi Vacuum: 0.8bar.
HYPERVISION V 2000 is a scanning electron microscope (SEM) that has been developed to provide high resolution imaging of topographical and conductive samples. The microscope is equipped with a high quality inverted column system, which includes a differential pumping stage that is capable of maintaining high-vacuum conditions over a wide range of sample types. V 2000 also features a digital imaging source with a dedicated electron gun and digital cameras, providing imaging capabilities of up to 200,000X. The microscope is operated with a user-friendly touch screen control panel and is designed for ease of use for both routine and advanced material analysis. HYPERVISION V 2000 has several imaging modes including bright and dark field, secondary and backscattered electron imaging. It is also equipped with advanced automated analysis and image processing capabilities, including histogram analysis, 3D surface analysis, and automated particle size and shape analysis. V 2000 is designed for operation under cryo-conditions and is equipped with a wide range of manipulator options including 6-axes manipulator, EDS analysis with advanced data analysis and full control over step size, and high-resolution energy selective imaging, enabling researchers to perform very detailed elemental and topographical studies. HYPERVISION V 2000 offers many additional features in order to optimize sample analysis, such as an intelligent beam deflector which allows automated mapping of samples, automated stage movements which enable faster imaging and improved efficiency, and a low kV source that provides the opportunity to map ultra-low chamber and background levels. Overall, V 2000 is a highly capable scanning electron microscope that provides powerful, high resolution imaging capabilities, robust and reliable performance under varied cryogenic conditions, and will reduce labor-intensive manual analysis. It is a great tool for researchers in the material sciences and will no doubt prove to be an invaluable tool for furthering research and analysis.
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