Used ISI / AKASHI DS 130C #9080012 for sale

ISI / AKASHI DS 130C Scanning Electron Microscope (SEM) is an advanced imaging and analysis equipment. The microscope uses modern scanning electron optics and imaging technology to provide users with high resolution imaging and analysis of individual nanostructures and nanometer-scale features. The system has an adjustable accelerating voltage across a range of 0.1 to 30 kV, making it suitable for a wide range of research and industrial applications. The SEM comes with a high-resolution, Eucentric column offering excellent geometric stability and high-resolution imaging capability. High-resolution SEM images are produced using a combination of digital imaging techniques and image processing algorithms, resulting in optimized images with extremely high contrast and resolution. The SEM uses wide angle gun and field-emission source technology to provide a bright, uniform image even at low accelerating voltages. A large variety of detector configurations, such as secondary electron (SE) imaging, in-lens SE and backscattered (BSE) electron imaging, and energy dispersive X-ray spectrometry (EDS) analysis is featured. The SE and BSE imaging detectors are equipped with an Ar ion gun source for post-wash cleaning. To optimize sample handling in the SEM, the stage can be moved within a wide range of angles and XY coordinates by an automated motorized drive unit. Adapters of various sizes can be used for attaching sample holders, and a sample loading area is included on the front of the machine. Autofocus functionality is also available to maintain optimal image quality as changes in the sample environment occur. In addition to its imaging and sample manipulation capabilities, ISI DS 130C SEM offers a range of analytical capabilities that provide users with in-depth compositional and structural information. These include advanced EDS with X-ray mapping capabilities, chemical imaging, phase analysis, and cathodoluminescence measurements. The compatible accessories and software range from a low-vacuum scan module to an automated stage control, to various sample holders and electron detectors. A wide range of analysis software is also available, offering powerful image analysis, statistical analysis, and 3D reconstruction tools. AKASHI DS 130C SEM is an ideal platform for imaging and analyzing nanostructures and nanometer-scale features due to its adjustable accelerating voltage, high-resolution imaging capabilities, and a wide range of analytical accessories and software. Its high-performing and automated design make it the perfect choice for a wide range of research and industrial applications.