Used ISI / AKASHI DS 130F #9080013 for sale

ISI / AKASHI DS 130F scanning electron microscope is a versatile tool used in a wide range of research and industrial environments. Offering a wide range of analytical capabilities, it is a high-end scanning electron microscope (SEM) for advanced users. ISI DS 130F scanning electron microscope is designed for a variety of analytical purposes. Its key features include high resolution imaging, large working distance, and low noise performance. The high resolution imaging enables crystal lattice imaging up to 30nm, perfect for material microstructure analysis. It also enables imaging of minute surface features and structures with three-dimensional capabilities. With a large working distance up to 6.5mm, this provides precise positioning and navigation capabilities. The low noise performance guarantees accurate and reliable data capture. AKASHI DS 130F scanning electron microscope boasts various operational modes including point imaging, line imaging, and 3D analysis with 2D to 3D addition. Point imaging allows the microscope to display topographical features with high visibility and clarity. Line imaging produces high-contrast flat images with sharp edges. 3D analysis captures surface features and structures in a 3D representation for more accurate results. DS 130F scanning electron microscope also offers user-friendly features. It is equipped with a variety of accessories to increase its efficiency and to aid users suchas gas-injection system, high-speed image capture, and user-friendly software. The gas stabilization system enables specimen control and maintains proper sample conditions. The high-speed image capture allows for rapid and simultaneous imaging and analysis of specimens. The user-friendly software guarantees user-friendly control and operation with ease. ISI / AKASHI DS 130F scanning electron microscope offers superior performance and precision. Its robust design and advanced capabilities make it a desirable SEM model for a wide range of research, industrial, and educational applications. This scanning electron microscope provides unparalleled performance for accurate, reliable, and superior imaging and analysis of microscopic specimens.