Used ISI / AKASHI DS 150F #9119620 for sale

ISI / AKASHI DS 150F
ID: 9119620
Scanning electron microscope, (SEM).
ISI / AKASHI DS 150F is an advanced scanning electron microscope (SEM) manufactured by the Japanese company ISI. This type of microscope is used to obtain high-resolution images and three-dimensional images of surfaces on the nanoscale. ISI DS 150F features a high-powered electron gun, enabling it to generate the necessary energy to excite the electron in the sample and produce images of up to 50nm resolution. It has a semi-automatic design that allows for easy operation for users of all levels. AKASHI DS 150F utilizes a wide range of capabilities to generate detailed, high-quality images. It is equipped with an automated stage-tracking system, making it easier to monitor and adjust the positioning of a sample during imaging. A built-in digital camera allows for live imaging monitoring, as well as image capture for further viewing and analysis. Additionally, DS 150F supports a variety of imaging modes, such as secondary electron imaging, backscatter electron imaging, and imaging at high magnification. For additional convenience, the microscope also comes with an intuitive control software interface. ISI / AKASHI DS 150F is designed to provide high-performance imaging in various applications. It offers multiple imaging parameters and is capable of operating in low- to high-vacuum conditions. It is also equipped with a specialized cooling system for stable operation in a wide temperature range. Moreover, ISI DS 150F features a wide-angle stage, eliminating the need for a separate sample rotator, and is capable of imaging samples up to a width of 150mm without the requirement of any alignment. Overall, AKASHI DS 150F is a powerful and user-friendly scanning electron microscope that provides users with a comprehensive range of imaging capabilities. With its cutting-edge features and easy-to-use design, this type of microscope is an ideal solution for a wide range of applications that require high-resolution imaging down to the nanoscale.
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