Used ISI / AKASHI HM-125 #293643647 for sale

ISI / AKASHI HM-125 Scanning Electron Microscope (SEM) is a dedicated, high-precision imaging system designed for research, industrial and educational use. This powerful microscopy solution offers valuable insight into the microscopic world, with the ability to generate images from samples as small as 1 nanometer in size. ISI HM-125 SEM features an impressive array of components, which allow it to generate high-quality images of both inorganic and organic samples. Specialized electron optics allow AKASHI HM-125 to focus the beam on the sample, while a scanning unit is used to scan the beam across the sample's surface. The SEM also includes a x, y, z specimen stage that provides adjustable up/down, left/right and forward/backward motion, allowing samples to be precisely located on the specimen holder. A Peltier cooler can be used to reduce the heating of the sample during imaging. HM-125 SEM is also equipped with a range of imaging modes, which can be used to study a variety of sample characteristics. Secondary electron imaging mode is most commonly used for imaging high aspects of surface characteristics, and backscatter electron imaging mode is ideal for imaging the inner structures of samples. Finally, the SEM's variable pressure imaging mode reduces the space between the sample and the detector, allowing for fewer artifacts and improved contrast. ISI / AKASHI HM-125 SEM is a highly-versatile imaging tool, capable of producing detailed images of samples with a wide range of size, material and structure. Its highly-sensitive electron optics and adjustable stage allow for precise positioning and control of sample imaging, while the range of available imaging modes offers valuable insight into the microscopic world. The versatile and powerful capabilities of ISI HM-125 SEM make it an ideal choice for research, industrial and educational labs looking to explore the microscopic world.