Used ISI DS 130B #9308918 for sale

ISI DS 130B, manufactured by ISI Atomscan Instruments, is a scanning electron microscope (SEM). It is a type of electron microscope that uses a focused beam of electrons to scan a sample surface and build a secondary electron signal that is used to create a high-resolution image of the sample. DS 130B is equipped with a 3 axis motorized X-Y stage that enables precise sample positioning. It has an adjustable electron beam current of up to 20mA, 200V - 2kV accelerating voltage, and a high secondary electron signal output. Various operating modes are available, such as SE, BSE, or ESEM (Environmental Scanning Electron Microscopy). Thanks to its electronic contrast, ISI DS 130B provides a highly detailed surface topographical image with a resolution of up to 2nm. The images obtained with its SE detector possess an improved resolution, which is further enhanced with its BSE detector mode. DS 130B is equipped with a Piezo Lift Prober with a gate-controlled lift height and scanning area, enabling reliable and precise measurements. The Piezo Lift Prober is designed to minimize interference with the specimen while maintaining highest accuracy during operation. Features such as auto-focus, auto alignment, and image stitching also make ISI DS 130B an excellent choice for topographical imaging such as wafer analysis. Additionally, the AppHeater™ specimen holder increases sample reliability and minimizes particle contamination during sample preparation. DS 130B is a reliable and easy-to-use scanning electron microscope designed for high-resolution imaging of samples. It has extreme accuracy for precise measurements, and its operating modes guarantee a high quality secondary electron signal even for complex samples.