Used ISI IR Snapshot 525 #9007644 for sale

ISI IR Snapshot 525 is a scanning electron microscope (SEM) with an integral infrared spectrometer (IR) system, designed to be a fully integrated system for examining samples with both optical and atomic force microscopes. The combination of these two powerful microscopy tools make IR Snapshot 525 well suited for applications in materials science, physical sciences, and life sciences. With its advanced imaging capabilities, users can easily access and measure areas of interest, capturing both topographical and chemical information. ISI IR Snapshot 525 is designed with an integrated optics column, vacuum chambers, and electron source to provide a suite of imaging capabilities. The SEM component uses a cold field emission gun (FEG) to generate a focused electron beam, which is used to generate images with a resolution of 2nm. The microscope is also configured with a backscatter detector, used to measure the atomic and elemental composition of the sample. To facilitate imaging, the microscope includes a 6-axis sample stage and a large field of view (FOV), allowing users to accurately image larger areas of interest. The IR component of IR Snapshot 525 uses Fourier Transform Infrared Spectroscopy (FTIR), an analytical technique that measures the absorption of infrared radiation from samples. In ISI IR Snapshot 525, the FTIR is combined with a 4cm focal length IR microscope, enabling researchers to take high-resolution IR spectra images while remaining focused on the sample. IR Snapshot 525 comes with a complete set of software tools for controlling the entire imaging setup. The software enables researchers to automate tasks, such as increasing the gain or gain adjustment, setting exposure times, defining image contours, and managing user profiles and credentials. Additionally, the software includes a built-in sequence editor that allows users to customize imaging sequences and save them for future use. In conclusion, ISI IR Snapshot 525 is an advanced SEM with a unique combination of features, including a FEG electron source, integrated optics column, vacuum chambers, and an integral FTIR spectrometer. This platform offers a range of imaging capabilities, with a resolution of 2nm and a large field of view, allowing users to accurately capture topographical and chemical information from the sample. In addition, the integrated software tools provide a wide range of customizable imaging features, ensuring ease-of-use and control of the system.