Used ISI Norgren SUYB-YB-9-1800-U1-M1-R1-2845-BSL #178333 for sale

A scanning electron microscope, such as ISI Norgren SUYB-YB-9-1800-U1-M1-R1-2845-BSL, is an advanced optical microscopy system capable of producing images of structures smaller than the wavelength of visible light. This advanced microscope utilizes a focused electron beam to scan a surface and produce a digital image of the scanned material. The operator controls the intensity and direction of the electron beam to determine the resolution and size of the image produced. Norgren SUYB-YB-9-1800-U1-M1-R1-2845-BSL is a scanning electron microscope equipped with advanced functionality for image optimization. Its components include a scanning electron microscope column assembly, controller, control unit, and other related elements. The microscope column is designed with a long working distance and a high-resolution objective lens. The objective lens is capable of magnifying structures up to 1000x. The control unit is equipped with a digital signal processor and a set of flat detector arrays that collect and process the signals generated by the scanning electron beam. The controller includes a high-speed electronic system and an intuitive user interface that facilitates the efficient operation of the microscope. ISI Norgren SUYB-YB-9-1800-U1-M1-R1-2845-BSL also features adjustable vacuum settings and enhanced sample manipulation abilities. The microscope is designed with high-speed sample positioning capabilities and adjustable magnifications. Additionally, the microscope has been outfitted with numerous additional features such as variable stage vibration, automated focus control, and several imaging modes such as scanning transmission electron microscopy (STEM) and back-scattered electron imaging. The impressive resolution of Norgren SUYB-YB-9-1800-U1-M1-R1-2845-BSL allows for the study of complex sample structures and the detection of even the smallest changes in sample composition. It is a highly reliable and powerful tool for numerous imaging tasks, including analysis of sample surfaces, defect analysis, phase contrast imaging, material characterization, and automated approach control. Additionally, ISI Norgren SUYB-YB-9-1800-U1-M1-R1-2845-BSL features software packages for data processing, particle sizing, and slice imaging.