Used ISI SS40 #114649 for sale

ISI SS40 Scanning Electron Microscope (SEM) is a versatile instrument used for a wide range of high resolution imaging and elemental analysis applications. Its most notable feature is its ability to produce images with resolutions up to 0.5 nm, making it the high end choice for nanoscale imaging and analysis. At the core of the SEM is an electron source - a filament or field-emission cathode. This source emits a stream of electrons which are scanned across the sample that is fixed in the specimen chamber. As these electrons interact with the sample a secondary electron signal is emitted and detected by the SEM's detector. These signals are amplified and displayed on the SEM's monitor to visualize the specimen. The SEM also features a range of detectors that allow the user to gain a better understanding of the sample's characteristics. These include a secondary electron detector and an energy dispersive x-ray spectroscopy detector, both of which can give elemental information of the sample. The ISIS SS40 also offers a choice of electron optical columns - from a standard column to more advanced medium high voltage (MV) column - allowing for varying amounts of magnification as well as enhanced resolution. The SEM is also equipped with Image Capture Software (ICS) which allows for the capture of high resolution images, videos and quantitative measurements of the sample. It has a real-time image enhancement tool, allowing for easy manipulation of images for clear visualization of structures. The compact and ergonomic design of ISI SS40 allows for easy transport and setup in research laboratories. The instrument has a height adjustable stage, a range of magnification settings and an array of interchangeable lenses, making it easily customizable for different types of samples and experiments. For those looking for a high end SEM with the versatility, reliability and heavy imaging capabilities, SS40 Scanning Electron Microscope is an ideal choice. With its high resolution imaging and elemental analysis capabilities, it allows users to gain a better understanding of the specimens they put under it.