Used ISI SS40 #293799644 for sale

The JEOL JSM-7001F ISI SS40 is a high-performance field emission scanning electron microscope (FE-SEM). It is capable of high resolution imaging (1.5nm) over large fields of view. The SEM has an in-column energy filter and a built-in electron energy loss spectrometer (EELS) for chemical composition analysis, and a built-in scintillation detector for backscattered electron (BSE) imaging. SS40 utilizes an advanced FE gun for high contrast and resolution imaging. This is based around a gated extractor equipment and permanent focusing coils to maintain the stability of the gun. The specimen chamber and samples are kept in a vacuum, allowing this microscope to work in ultrahigh vacuum (UHV) if needed. For sample manipulation, ISI SS40 has a sample stage with xyz propulsion drives, providing a full range of motion. For imaging, SS40 has an in-column energy filter and EELS built in. Together, they can perform energy dispersive spectroscopy (EDS) and wavelength dispersive spectroscopy (WDS) analysis. The in-column filter provides a high contrast image of the sample in both light and darkfield modes. The EELS detector is mounted at the column base and is capable of acquiring spectra as well as creating 2D maps of the sample. ISI SS40 also includes a backscattered electron detector to create BSE images. This detector is mounted in the lower chamber and is capable of detecting electrons scattered from a sample with a high degree of efficiency. With this detector, users can create high contrast images of the sample. Finally, SS40 has an automated vacuum control system to maintain optimal operational pressure. This unit provides real-time monitoring of the chamber pressure and employs a Computerized Maintenance Machine to indicate maintenance and cleaning needs in a timely manner. Overall, ISI SS40 is a powerful and versatile field emission scanning electron microscope. It is capable of high resolution imaging and EELS, WDS, and BSE analysis to provide a comprehensive understanding of complex nanomaterials.